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arXiv 1111.4098cond-mat.supr-con
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过渡边缘传感器中作为热涨落噪声源的正常金属-超导体去耦

Normal metal - superconductor decoupling as a source of thermal fluctuation noise in transition-edge sensors

K. M. Kinnunen, M. R. J. Palosaari, I. J. Maasilta

摘要:

我们研究了超导过渡边缘传感器(TES)与几种不同的检测器设计的过量噪声的来源。我们发现,大多数观察到的噪声和复阻抗功能可以解释由三个机构组成的热模型。我们认为,热块和相应的热涨落噪声之一的出现是由于高频热退耦的正常和超导相区内的TES膜。我们的结果也与在薄双层近似超导体中,在临界温度处热容的跃变小于普遍BCS理论结果的预测相一致。

英文摘要:

We have studied the origin of excess noise in superconducting transition-edge sensors (TES) with several different detector designs. We show that most of the observed noise and complex impedance features can be explained by a thermal model consisting of three bodies. We suggest that one of the thermal blocks and the corresponding thermal fluctuation noise arises due to the high-frequency thermal decoupling of the normal and superconducting phase regions inside the TES film. Our results are also consistent with the prediction that in thin bilayer proximitized superconductors, the jump in heat capacity at the critical temperature is smaller than the universal BCS theory result.

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