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arXiv 1105.6090cond-mat.str-el
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La2-xSrxCuO4薄膜的电导各向异性和线性磁电阻

Conductance anisotropy and linear magnetoresistance in La2-xSrxCuO4 thin films

M. van Zalk, A. Brinkman, H. Hilgenkamp

摘要:

对La_(2-x)Sr_xCuO_4(LSCO)薄膜(0.10 < x < 0.25)的电导各向异性和磁电阻进行了详细的研究。这两个观测值是有希望的条纹检测。通过测量零磁场下的横向电阻Rxy,揭示了电导各向异性的细微特征。它表明,Rxy的符号取决于LSCO霍尔条相对于衬底的平台结构的取向。因此,单元格高的衬底台阶边缘必须是薄膜生长过程中反相边界的主要成核源。结果表明,在105 K时,Rxy的测量灵敏度足以检测SrTiO 3(100)(STO)衬底的ε-四元相变。LSCO薄膜的MR在0.10 < x < 0.25时表现出非单调的温度依赖性,这是由于MR在90 K以上出现线性项所致。我们表明,线性MR尺度与霍尔电阻率的绝对值,与温度无关的比例常数。这样的缩放表明,线性MR起源于由结构或电子不均匀性引起的电流畸变。条纹的MR和电导各向异性的可能作用进行了讨论。

英文摘要:

We have performed a detailed study of conductance anisotropy and magnetoresistance (MR) of La2-xSrxCuO4 (LSCO) thin films (0.10 < x < 0.25). These two observables are promising for the detection of stripes. Subtle features of the conductance anisotropy are revealed by measuring the transverse resistance Rxy in zero magnetic field. It is demonstrated that the sign of Rxy depends on the orientation of the LSCO Hall bar with respect to the terrace structure of the substrate. Unit-cell-high substrate step edges must therefore be a dominant nucleation source for antiphase boundaries during film growth. We show that the measurement of Rxy is sensitive enough to detect the cubic-tetragonal phase transition of the SrTiO3(100) (STO) substrate at 105 K. The MR of LSCO thin films shows for 0.10 < x < 0.25 a non-monotonic temperature dependence, resulting from the onset of a linear term in the MR above 90 K. We show that the linear MR scales with the absolute Hall resistivity, with the constant of proportionality independent of temperature. Such scaling suggests that the linear MR originates from current distortions induced by structural or electronic inhomogeneities. The possible role of stripes for both the MR and the conductance anisotropy is discussed throughout the paper.

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