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arXiv 1104.2658cond-mat.mtrl-scicond-mat.mes-hall
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肖特基隧道接触探测硅沟道中自旋积累信号的偏置电流依赖性

Bias current dependence of spin accumulation signals in a silicon channel detected by a Schottky tunnel contact

Y. Ando, K. Kasahara, K. Yamane, Y. Baba, Y. Maeda, Y. Hoshi, K. Sawano, M. Miyao, K. Hamaya

摘要:

我们研究了铁磁-硅界面自旋积累的电学检测,这可以通过测量三端横向器件中的Hanle效应来验证。所使用的器件结构由半导体Si沟道和高质量肖特基隧道接触组成。在低电流偏置区,Hanle效应曲线仅在正向偏压条件下观察到。这可以认为正向偏置接触的电可检测性高于反向偏置接触的电可检测性。这是可能的证据检测自旋极化的电子中产生的Si通道。

英文摘要:

We study the electrical detection of spin accumulation at a ferromagnet-silicon interface, which can be verified by measuring a Hanle effect in three-terminal lateral devices. The device structures used consist of a semiconducting Si channel and a high-quality Schottky tunnel contact. In a low current-bias region, the Hanle-effect curves are observed only under forward bias conditions. This can be considered that the electrical detectability of the forward-biased contact is higher than that of the reverse-biased contact. This is possible evidence for the detection of spin-polarized electrons created in a Si channel.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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