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arXiv 1101.0633cond-mat.mtrl-sci
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邻位BiFeO3(001)薄膜中台阶聚束引起的垂直晶格失配和晶体学倾斜

Step bunching-induced vertical lattice mismatch and crystallographic tilt in vicinal BiFeO3(001) films

T. H. Kim, S. H. Baek, S. Y. Jang, S. M. Yang, S. H. Chang, T. K. Song, J. -G. Yoon, C. B. Eom, J. -S. Chung, T. W. Noh

摘要:

在相邻SrTiO 3衬底上外延生长的(001)BiFeO 3薄膜受到衬底的各向异性应力。利用X射线衍射技术定量分析了晶格失配引起的晶体学倾斜角和c晶格常数沿薄膜厚度的变化。通过推广Nagai模型,我们估计了台阶聚束如何导致相邻BiFeO3层之间的垂直晶格失配,从而诱导应变弛豫和晶体学倾斜。通过BiFeO 3表面上增加的平台宽度证实了台阶聚束。

英文摘要:

Epitaxial (001) BiFeO3 thin films grown on vicinal SrTiO3 substrates are under large anisotropic stress from the substrates. The variations of the crystallographic tilt angle and the c lattice constant, caused by the lattice mismatch, along the film thickness were analyzed quantitatively using the X-ray diffraction technique. By generalizing the Nagai model, we estimated how step bunching resulted in the vertical lattice mismatch between adjacent BiFeO3 layers, which induced the strain relaxation and crystallographic tilt. The step bunching was confirmed by the increased terrace width on the BiFeO3 surface.

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