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arXiv 1012.4760cond-mat.mtrl-sci
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(Ga,Mn)As外延薄膜基本光学性质的光反射研究

Photoreflectance Study of the Fundamental Optical Properties of (Ga,Mn)As Epitaxial Films

O. Yastrubchak, J. Zuk, H. Krzyzanowska, J. Z. Domagala, T. Andrearczyk, J. Sadowski, T. Wosinski

摘要:

用光反射谱(PR)研究了低温分子束外延生长的低Mn含量(1%)和高Mn含量(6%)的(Ga,Mn)As稀磁半导体薄膜以及参考GaAs薄膜的基本光学性质。此外,薄膜进行了补充表征超导量子干涉仪(SQUID)的磁力,拉曼光谱,和高分辨率的X射线衍射。通过对PR谱的全线形分析,确定了(Ga,Mn)As中的E0电子跃迁,发现两种(Ga,Mn)As薄膜在布里渊区的Γ点附近的能量能带结构存在显著差异。根据实验结果,讨论了(Ga,Mn)As中价带结构随Mn含量增加的演化,指出Mn含量高时,与Mn有关的杂质带与宿主GaAs的价带合并。

英文摘要:

Fundamental optical properties of thin films of (Ga,Mn)As diluted ferromagnetic semiconductor with a low (1%) and high (6%) Mn content and of a reference GaAs film, grown by low-temperature molecular-beam epitaxy, have been investigated by photoreflectance (PR) spectroscopy. In addition, the films were subjected to complementary characterization by means of superconducting quantum interference device (SQUID) magnetometry, Raman spectroscopy, and high resolution X-ray diffractometry. Thorough full-line-shape analysis of the PR spectra, which enabled determination of the E0 electronic transition in (Ga,Mn)As, revealed significant differences between the energy band structures in vicinity of the Γ point of the Brillouin zone for the two (Ga,Mn)As films. In view of the obtained experimental results the evolution of the valence band structure in (Ga,Mn)As with increasing Mn content is discussed, pointing to a merging the Mn-related impurity band with the host GaAs valence band for high Mn content.

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