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arXiv 1012.3489cond-mat.mtrl-sciphysics.comp-ph
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InAs量子点偏振相关光跃迁的实验和理论研究

Experimental and Theoretical Study of Polarization-dependent Optical Transitions from InAs Quantum Dots at Telecommunication-Wavelengths (1.3-1.5μm)

Muhammad Usman, Susannah Heck, Edmund Clarke, Peter Spencer, Hoon Ryu, Ray Murray, Gerhard Klimeck

摘要:

一些光学器件的设计,如用于电信应用的半导体光放大器,要求在长波长(1300-1550 nm)处的偏振不敏感的光发射。自组装的InAs/GaAs量子点(QD)通常在短于1300 nm的波长下表现出具有高度偏振敏感特性的基态光发射,尽管这可以通过使用低生长速率、引入应变减小的覆盖层或生长紧密堆叠的QD层来修改。利用紧密堆叠的QD层之间的应变相互作用还允许在选择上层的生长条件方面有更大的自由度,使得由于QD尺寸、应变和组成的修改,可以实现它们的发射波长的显著延伸和改进的偏振响应。在本文中,我们研究了单个和堆叠的量子点层的偏振行为,使用室温亚激光阈值电致发光和光电压测量以及原子建模与NEMO 3-D模拟器。与单个QD层相比,观察到GaAs覆盖的QD堆叠的横电(TE)与横磁(TM)光学模式响应的比率的降低,但是当两层堆叠的第二层是InGaAs覆盖的时,观察到TE/TM比率的增加,这与最近关于单个QD层的报道相反。

英文摘要:

The design of some optical devices such as semiconductor optical amplifiers for telecommunication applications requires polarization-insensitive optical emission at the long wavelengths (1300-1550 nm). Self-assembled InAs/GaAs quantum dots (QDs) typically exhibit ground state optical emission at wavelengths shorter than 1300 nm with highly polarization-sensitive characteristics, although this can be modified by using low growth rates, the incorporation of strain-reducing capping layers or growth of closely-stacked QD layers. Exploiting the strain interactions between closely stacked QD layers also allows greater freedom in the choice of growth conditions for the upper layers, so that both a significant extension in their emission wavelength and an improved polarization response can be achieved due to modification of the QD size, strain and composition. In this paper we investigate the polarization behavior of single and stacked QD layers using room temperature sub-lasing-threshold electroluminescence and photovoltage measurements as well as atomistic modeling with the NEMO 3-D simulator. A reduction is observed in the ratio of the transverse electric (TE) to transverse magnetic (TM) optical mode response for a GaAs-capped QD stack compared to a single QD layer, but when the second layer of the two-layer stack is InGaAs-capped an increase in the TE/TM ratio is observed, in contrast to recent reports for single QD layers.

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