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arXiv 1005.2099cond-mat.mes-hall
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Si(111)衬底上外延Bi(111)薄膜金属-绝缘转变的起源

Origin of the metallic to insulating transition of an epitaxial Bi(111) film grown on Si(111)

F. Pang, X. J. Liang, Z. L. Liao, S. L. Yin, D. M. Chen

摘要:

发现Si(111)-7 \times 7上单晶铋膜在TC以下和TC以上的输运特性分别为金属性和绝缘性。转变温度TC随膜厚的增加而降低。结合薄膜电阻率的厚度依赖性,我们发现绝缘行为源于膜内态,而金属行为源于界面态。我们表明,量子尺寸效应在Bi膜,如半金属到半导体的转变,是唯一可观察到的温度高于TC。此外,金属界面态被证明是由于大的SO-分裂在界面处。

英文摘要:

Transport characteristics of single crystal bismuth films on Si(111)-7 \times 7 are found to be metallic or insulating at temperature below or above TC, respectively. The transition temperature TC decreases as the film thickness increases. By combining thickness dependence of the films resistivity, we find the insulating behavior results from the states inside film, while the metallic behavior originates from the interface states. We show that quantum size effect in a Bi film, such as the semimetal-to-semiconductor transition, is only observable at a temperature higher than TC. In addition, the metallic interface state is shown to result from the large SO-splitting at interfaces.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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