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arXiv 1004.2204cond-mat.supr-con
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金属有机物沉积涂层导体的单个晶界特性和整体性能

Individual grain boundary properties and overall performance of metal-organic-deposition coated conductors

M. Weigand, S. C. Speller, G. M. Hughes, N. A. Rutter, S. Lozano-Perez, C. R. M. Grovenor, J. H. Durrell

摘要:

我们研究了金属有机物沉积(MOD)产生的涂层导体中孤立的单晶界(GBs)。当磁场在薄膜平面内扫过时,临界电流密度Jc随角度的变化而变化,在无力取向下,即使磁场高达8 T,晶界仍限制Jc。我们推断,这种效果是一个直接的后果GB蜿蜒。我们采用这些单一的GB结果来解释Jc的多晶轨道上的宽度的依赖关系:面内测量变得平坦的轨道缩小。这一结果是一致的更强的GB限制在外地配置接近力免费发现从孤立的边界。我们的研究表明,对于某些几何形状,即使在高场的影响,GBs不能忽略。

英文摘要:

We have investigated single grain boundaries (GBs) isolated in coated conductors produced by Metal-Organic Deposition (MOD). When a magnetic field is swept in the film plane, an angle-dependent crossover from boundary to grain limited critical current density Jc is found. In the force-free orientation, even at fields as high as 8 T, the GBs still limit Jc. We deduce that this effect is a direct consequence of GB meandering. We have employed these single GB results to explain the dependence of Jc of polycrystalline tracks on their width: in-plane measurements become flatter as the tracks are narrowed down. This result is consistent with the stronger GB limitation at field configurations close to force-free found from the isolated boundaries. Our study shows that for certain geometries even at high fields the effect of GBs cannot be neglected.

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