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arXiv 1003.5559cond-mat.supr-con
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电子掺杂无限层Sr $_{0.88}$ La $_{0.12}$ CuO $_{2+x}$薄膜的穿透深度

Penetration depth of electron-doped-infinite-layer Sr$_{0.88}$La$_{0.12}$CuO$_{2+x}$ thin films

L. Fruchter, V. Jovanovic, H. Raffy, Sid Labdi, F. Bouquet, Z. Z. Li

摘要:

用交流磁化率测量法测量了氧还原法制备的不同掺杂的$_{0.88}$ CuO $_{2+x}$薄膜的面内穿透深度。对于较高的掺杂样品,超流密度偏离强烈的s波行为,这表明,与其他电子掺杂的铜酸盐类似,从节孔口袋,或费米表面上的小间隙,如各向异性的s波序参量的贡献。超流密度的低值可能是由于强掺杂引起的无序,使我们样品的超导转变处于相位波动状态。

英文摘要:

The in-plane penetration depth of Sr$_{0.88}$La$_{0.12}$CuO$_{2+x}$ thin films at various doping obtained from oxygen reduction has been measured, using AC susceptibility measurements. For the higher doping samples, the superfluid density deviates strongly from the s-wave behavior, suggesting, in analogy with other electron-doped cuprates, a contribution from a nodal hole pocket, or a small gap on the Fermi surface such as an anisotropic s-wave order parameter. The low value of the superfluid densities, likely due to a strong doping-induced disorder, places the superconducting transition of our samples in the phase-fluctuation regime.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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