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arXiv 1001.4050cond-mat.mes-hallcond-mat.mtrl-sci
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Bi $_2$ Se $_3$中体费米面与狄拉克面共存:光电能谱与Shubnikov-de Haas测量的比较

Bulk Fermi surface coexistence with Dirac surface state in Bi$_2$Se$_3$: a comparison of photoemission and Shubnikov-de Haas measurements

James G. Analytis, Jiun-Haw Chu, Yulin Chen, Felipe Corredor, Ross D. McDonald, Z. X. Shen, Ian R. Fisher

摘要:

Shubnikov de Haas(SdH)振荡和角分辨光电子能谱(ARPES)被用来探测Bi 2Se 3单晶的费米面。我们发现,SdH和ARPES探针定量同意测量的有效质量和散装带色散。在高载流子密度的样品中,两个探针也同意在费米能级EF的确切位置,但对于较低的载流子密度的样品的差异出现在EF的位置。特别是,SdH揭示了载流子密度低至10^17cm-3的样品的体三维费米表面。我们提出了一个简单的机制来解释这些差异,并讨论了现有的和未来的拓扑绝缘体输运研究的后果。

英文摘要:

Shubnikov de Haas (SdH) oscillations and Angle Resolved PhotoEmission Spectroscopy (ARPES) are used to probe the Fermi surface of single crystals of Bi2Se3. We find that SdH and ARPES probes quantitatively agree on measurements of the effective mass and bulk band dispersion. In high carrier density samples, the two probes also agree in the exact position of the Fermi level EF, but for lower carrier density samples discrepancies emerge in the position of EF. In particular, SdH reveals a bulk three-dimensional Fermi surface for samples with carrier densities as low as 10^17cm-3. We suggest a simple mechanism to explain these differences and discuss consequences for existing and future transport studies of topological insulators.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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