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arXiv 0909.4104cond-mat.mes-hallcond-mat.mtrl-sci
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利用脉冲表征技术减小碳纳米管迁移率测量的滞后

Reduction of Hysteresis for Carbon Nanotube Mobility Measurements Using Pulsed Characterization

David Estrada, Sumit Dutta, Albert Liao, Eric Pop

摘要:

我们描述了一种脉冲测量技术,以抑制滞后的碳纳米管(CNT)器件测量在空气中,真空中,并在很宽的温度范围(80-453 K)。改变栅极脉冲宽度和占空比探针的弛豫时间与附近的CNT的电荷捕获,发现是高达0.1-10秒的范围。电压脉冲之间较长的关断时间可实现CNT迁移率的一致、无干扰测量。还描述了电荷捕获和弛豫的隧穿前沿模型,表明SiO2上CNT的陷阱深度可达4-8 nm。脉冲测量也将适用于其他纳米级器件,如石墨烯,纳米线和分子电子学,并可以使探测陷阱弛豫时间在各种材料系统界面。

英文摘要:

We describe a pulsed measurement technique to suppress hysteresis for carbon nanotube (CNT) device measurements in air, vacuum, and over a wide temperature range (80-453 K). Varying the gate pulse width and duty cycle probes the relaxation times associated with charge trapping near the CNT, found to be up to the 0.1-10 s range. Longer off times between voltage pulses enable consistent, hysteresis-free measurements of CNT mobility. A tunneling front model for charge trapping and relaxation is also described, suggesting trap depths up to 4-8 nm for CNTs on SiO2. Pulsed measurements will also be applicable to other nanoscale devices such as graphene, nanowires, and molecular electronics, and could enable probing trap relaxation times in a variety of material system interfaces.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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