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arXiv 0909.3096cond-mat.str-elcond-mat.supr-con
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掺杂莫特绝缘体中低能费米自由度的不守恒

Non-conservation of Fermionic Degrees of Freedom at Low-energy in Doped Mott Insulators

Shiladitya Chakraborty, Seungmin Hong, Philip Phillips

摘要:

对铜氧化物的霍尔和光学电导率实验表明,掺杂莫特绝缘体中的低能费米子自由度具有动态产生的成分,因此由温度决定。我们明确地表明,在较低的哈伯德带的频谱应如何划分,以描述这种动态产生的电荷自由度,并证实了这一图片的结果,从确切的低能量理论的哈伯德模型。这样的动力学的一个结果是,在低能量下,裸电子和有效费米自由度之间的朗道一一对应关系被明确打破。这种情况之所以出现,是因为总空穴数不守恒,因为它包含动力学贡献。我们建议,任何实验探针,耦合到低能量动力学的掺杂莫特绝缘体,量子振荡实验包括,应解释的总动态产生的空穴数,而不是裸值。

英文摘要:

Hall and optical conductivity experiments on the cuprates indicate that the low-energy fermionic degrees of freedom in a doped Mott insulator posess a component that is dynamcially generated and hence determined by the temperature. We show explicitly how the spectrum in the lower Hubbard band should be partitioned to describe such dynamically generated charge degrees of freedom and corroborate this picture with the results from the exact low-energy theory of the Hubbard model. A consequence of such dynamics is that the Landau one-to-one correspondence between bare electrons and the effective fermionic degrees of freedom at low energies breaks down explicitly. This state of affairs obtains because the total hole number is not conserved as it contains a dynamical contribution. We propose that any experimental probe that couples to the low-energy dynamics of a doped Mott insulator, quantum oscillation experiments included, should be interpreted in terms of the total dynamically generated hole number rather than the bare value.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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