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arXiv 0908.2748cond-mat.mtrl-scicond-mat.mes-hall
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半导体表面扫描隧道谱系统误差的修正:0.3 K时Si(111)-7 × 7的能隙

Correction of systematic errors in scanning tunnelling spectra on semiconductor surfaces: the energy gap of Si(111)-7x7 at 0.3 K

S. Modesti, H. Gutzmann, J. Wiebe, R. Wiesendanger

摘要:

利用扫描隧道谱(STS)研究半导体表面的电子性质时,经常受到注入载流子的非平衡输运的阻碍。我们提出了一种对STS数据中产生的系统误差的校正方法,并对众所周知的Si(111)-(7 × 7)表面进行了验证。表面具有奇数个电子/表面晶胞,并且在20 K以上是金属的。在0.3 K时,我们用STS方法在该表面的基态观察到一个能隙.修正后,测量的间隙的宽度是(70 +- 15)meV,这是与以前不太精确的估计兼容。与Si(111)-(7 x7)表面的模型相比,在费米能级处没有观察到尖锐的态密度峰。

英文摘要:

The investigation of the electronic properties of semiconductor surfaces using scanning tunnelling spectroscopy (STS) is often hindered by non-equilibrium transport of the injected charge carriers. We propose a correction method for the resulting systematic errors in STS data, which is demonstrated for the well known Si(111)-(7x7) surface. The surface has an odd number of electrons per surface unit cell and is metallic above 20 K. We observe an energy gap in the ground state of this surface by STS at 0.3 K. After correction, the measured width of the gap is (70 +- 15) meV which is compatible with previous less precise estimates. No sharp peak of the density of states at the Fermi level is observed, in contrast to proposed models for the Si(111)-(7x7) surface.

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