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arXiv 0908.0265quant-ph
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纠缠源的表征

Characterizing Entanglement Sources

Pavel Lougovski, S. J. van Enk

摘要:

我们讨论了如何用有限的测量集来表征纠缠源。测量不一定是断层摄影完成的,并且可以由POVM而不是冯诺依曼测量组成。我们的方法得出了源产生纠缠态的概率以及任何所需的可计算纠缠度量的估计,包括其误差条。我们应用两个标准,即赤池的信息标准和贝叶斯信息标准,比较和评估不同的模型(不同数量的参数)描述纠缠生成设备。我们讨论了标准的纠缠验证方法和我们目前的纠缠源表征方法之间的差异。

英文摘要:

We discuss how to characterize entanglement sources with finite sets of measurements. The measurements do not have to be tomographically complete, and may consist of POVMs rather than von Neumann measurements. Our method yields a probability that the source generates an entangled state as well as estimates of any desired calculable entanglement measures, including their error bars. We apply two criteria, namely Akaike's information criterion and the Bayesian information criterion, to compare and assess different models (with different numbers of parameters) describing entanglement-generating devices. We discuss differences between standard entanglement-verificaton methods and our present method of characterizing an entanglement source.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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