arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0905.3045cond-mat.mes-hallcond-mat.supr-con

Qubit decoherence due to detector switching

I. Serban, F. K. Wilhelm

英文摘要:

We provide insight into the qubit measurement process involving a switching type of detector. We study the switching-induced decoherence during escape events. We present a simple method to obtain analytical results for the qubit dephasing and bit-flip errors, which can be easily adapted to various systems. Within this frame we investigate potential of switching detectors for a fast but only weakly invasive type of detection. We show that the mechanism that leads to strong dephasing, and thus fast measurement, inverts potential bit flip errors due to an intrinsic approximate time reversal symmetry.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑