强X射线脉冲辐照下团簇内强内场电离和电荷迁移
Ionization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses
摘要：
给出了强激光脉冲照射下有限样品中电荷迁移的一般情形。微观计算的强短脉冲下产生的X射线自由电子激光源的氖团簇证实了这种情况下，并点的强内场电离的突出作用。后者导致快速形成具有几乎静态的屏蔽离子核的核-壳系统，而外壳爆炸。用不同的材料（例如氦）代替壳离子作为牺牲层导致嵌入的团簇的衍射图像的实质性改善，从而减少相干衍射成像的辐射损伤的后果。
英文摘要：
A general scenario for electronic charge migration in finite samples illuminated by an intense laser pulse is given. Microscopic calculations for neon clusters under strong short pulses as produced by X-ray free-electron laser sources confirm this scenario and point to the prominent role of field ionization by strong internal fields. The latter leads to the fast formation of a core-shell system with an almost static core of screened ions while the outer shell explodes. Substituting the shell ions with a different material such as helium as a sacrificial layer leads to a substantial improvement of the diffraction image for the embedded cluster thus reducing the consequences of radiation damage for coherent diffractive imaging.
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