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arXiv 0908.2145physics.atm-clus
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laser驱动的团簇极端电离的阶跃强度阈值行为

Steplike intensity threshold behavior of extreme ionization in laser-driven Xe clusters

T. Döppner, J. P. Müller, A. Przystawik, S. Göde, J. Tiggesbäumker, K. -H. Meiwes-Broer, C. Varin, L. Ramunno, T. Brabec, T. Fennel

摘要:

在嵌入氦纳米液滴并暴露于强飞秒激光脉冲($λ$ =800 nm)的氦原子团簇中观察到高电荷的$^{q+}$离子直至{ $q=24$ }的产生。激光强度分辨测量表明,高$q$离子产生开始于约{10 $^{14}$ W/cm $^{2}$ }的出乎意料的低阈值强度.在阈值以上,离子的电荷谱迅速饱和,并在较高的激光强度下仅发生微弱的变化。这些观测结果和分子动力学分析之间的良好一致性使我们能够确定负责高电荷离子产生和电离过程的令人惊讶的强度阈值行为的机制。

英文摘要:

The generation of highly charged Xe$^{q+}$ ions up to {$q=24$} is observed in Xe clusters embedded in helium nanodroplets and exposed to intense femtosecond laser pulses ($λ$=800 nm). Laser intensity resolved measurements show that the high-$q$ ion generation starts at an unexpectedly low threshold intensity of about {10$^{14}$ W/cm$^{2}$}. Above threshold, the Xe ion charge spectrum saturates quickly and changes only weakly for higher laser intensities. Good agreement between these observations and a molecular dynamics analysis allows us to identify the mechanisms responsible for the highly charged ion production and the surprising intensity threshold behavior of the ionization process.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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