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arXiv 0811.3154cond-mat.supr-con
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短和长约瑟夫森结中的电子态寿命

Lifetime of the superconductive state in short and long Josephson junctions

Giuseppe Augello, Davide Valenti, Andrey L. Pankratov, Bernardo Spagnolo

摘要:

我们研究了热涨落和关联涨落影响下短、长约瑟夫森结的瞬态统计特性。特别是,我们调查的寿命的发现存在的噪声诱导的现象的双亚稳态。对于短的约瑟夫森结,我们调查的寿命作为一个函数的电流驱动信号的频率和噪声强度,我们发现这些噪声引起的影响是如何修改的相关噪声源的存在。对于长约瑟夫森结,我们数值积分的sine-Gordon方程计算的寿命作为一个函数的结的长度都不均匀和均匀的偏置电流分布。我们得到的非单调行为的寿命作为一个函数的电流驱动信号的频率和噪声的相关时间。此外,我们发现两个最大值的非单调行为的平均逃逸时间的相关噪声强度的函数。

英文摘要:

We study the transient statistical properties of short and long Josephson junctions under the influence of thermal and correlated fluctuations. In particular, we investigate the lifetime of the superconductive metastable state finding the presence of noise induced phenomena. For short Josephson junctions we investigate the lifetime as a function both of the frequency of the current driving signal and the noise intensity and we find how these noise-induced effects are modified by the presence of a correlated noise source. For long Josephson junctions we integrate numerically the sine-Gordon equation calculating the lifetime as a function of the length of the junction both for inhomogeneous and homogeneous bias current distributions. We obtain a nonmonotonic behavior of the lifetime as a function of the frequency of the current driving signal and the correlation time of the noise. Moreover we find two maxima in the nonmonotonic behaviour of the mean escape time as a function of the correlated noise intensity.

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