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arXiv 1007.2577cond-mat.supr-conquant-ph
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约瑟夫森结中二能级缺陷的寿命和相干性

Lifetime and Coherence of Two-Level Defects in a Josephson Junction

Yoni Shalibo, Ya'ara Rofe, David Shwa, Felix Zeides, Matthew Neeley, John Martinis, Nadav Katz

摘要:

我们测量了约瑟夫森相位量子比特绝缘势垒中二能级缺陷态的寿命($T_{1}$)和相干性($T_{2}$),并比较了两个系统之间的相互作用强度。我们发现平均衰减时间的幂律依赖于相应的相互作用强度,而平均相干时间,我们发现在中间耦合强度的最佳。我们解释了使用标准TLS模型,包括偶极辐射的声子和反相关的依赖于环境波动的能量参数的寿命和相干性的结果。

英文摘要:

We measure the lifetime ($T_{1}$) and coherence ($T_{2}$) of two-level defect states (TLSs) in the insulating barrier of a Josephson phase qubit and compare to the interaction strength between the two systems. We find for the average decay times a power law dependence on the corresponding interaction strengths, whereas for the average coherence times we find an optimum at intermediate coupling strengths. We explain both the lifetime and the coherence results using the standard TLS model, including dipole radiation by phonons and anti-correlated dependence of the energy parameters on environmental fluctuations.

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