HICS：高电荷离子与表面的碰撞
HICS: Highly charged ion collisions with surfaces
摘要：
本文介绍了一种用于研究高电荷态离子与表面相互作用的新型仪器的布局，该仪器由离子源、带电荷分离的束线和靶室组成。通过分别改变弹丸的荷电状态和撞击速度，可以独立地研究表面或表面以下的势能和动能的耗散。靶室提供了使用可调金属-绝缘体-金属装置作为内部电子激发的探测器，飞行时间系统，以研究撞击引起的粒子发射和将样品原位转移到超高真空扫描探针显微镜的可能性。样品和检测器也可以在原位制备。作为第一个例子，给出了用Xe 36+辐照的SrTiO 3上的石墨烯层的数据。关键词：高电荷态离子，溅射，原子力显微镜，石墨烯
英文摘要：
The layout of a new instrument designed to study the interaction of highly charged ions with surfaces, which consists of an ion source, a beamline including charge separation and a target chamber, is presented here. By varying the charge state and impact velocity of the projectiles separately, the dissipation of potential and kinetic energy at or below the surface can be studied independently. The target chamber offers the use of tunable metal-insulator-metal devices as detectors for internal electronic excitation, a timeof-flight system to study the impact induced particle emission and the possibility to transfer samples in situ to a UHV scanning probe microscope. Samples and detectors can be prepared in situ as well. As a first example data on graphene layers on SrTiO3 which have been irradiated with Xe36+ are presented. Key words: highly charged ions, sputtering, AFM, graphene
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