arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 0811.1379cond-mat.str-el
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铜氧化物的共振非弹性X射线散射谱与介电损耗函数的比较

Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides

Jungho Kim, D. S. Ellis, H. Zhang, J. P. Hill, F. C. Chou, T. Gog, D. Casa, Young-June Kim

摘要:

我们报告的经验比较铜K-边缘间接共振非弹性X射线散射(RIXS)光谱,在布里渊区中心,与光学介电损耗函数测量的铜氧化物的数量。获得了Bi $_2$ CuO $_2$、CuGeO $_3$、Sr $_2$ Cu $_3$ O $_4$ Cl $_2$、La $_2$ CuO $_4$和Sr $_2$ CuO $_2$ Cl $_2$的RIXS数据,并通过考虑入射和散射光子共振进行了分析。然后提取与入射能量无关的响应函数。的介电损耗函数,测量光谱椭圆偏振法,同意与此RIXS响应,特别是在Bi $_2$ CuO $_4$和CuGeO $_3$。

英文摘要:

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi$_2$CuO$_4$, CuGeO$_3$, Sr$_2$Cu$_3$O$_4$Cl$_2$, La$_2$CuO$_4$, and Sr$_2$CuO$_2$Cl$_2$, and analyzed by considering both incident and scattered photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi$_2$CuO$_4$ and CuGeO$_3$.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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