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arXiv 0810.3534cond-mat.mtrl-sci
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聚3-己基噻吩中陷阱分布及其对电荷输运的影响

Trap Distribution and the Impact of Oxygen-induced Traps on the Charge Transport in Poly(3-Hexylthiophene)

Julia Schafferhans, Andreas Baumann, Carsten Deibel, Vladimir Dyakonov

摘要:

用分数阶热激电流法研究了共轭聚合物聚3-己基噻吩中的陷阱分布。两个缺陷态的激活能约为50 meV和105 meV和高斯能量分布。第一个被分配到尾部的本征态密度,而第二个陷阱的浓度是直接相关的氧气暴露。通过线性增加电压测量进行光致载流子提取来检查氧诱导陷阱对电荷传输的影响,其显示出迁移率随空气暴露时间的强烈降低。

英文摘要:

The trap distribution in the conjugated polymer poly(3-hexylthiophene) was investigated by fractional thermally stimulated current measurements. Two defect states with activation energies of about 50 meV and 105 meV and Gaussian energy distributions were revealed. The first is assigned to the tail of the intrinsic density of states, whereas the concentration of second trap is directly related to oxygen exposure. The impact of the oxygen induced traps on the charge transport was examined by performing photo-induced charge carrier extraction by linearly increasing voltage measurements, that exhibited a strong decrease in the mobility with air exposure time.

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