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arXiv 0804.1222nucl-ex
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液态氩中氧污染对电离电子电荷和闪烁光的综合影响

Oxygen contamination in liquid Argon: combined effects on ionization electron charge and scintillation light

R. Acciarri, M. Antonello, B. Baibussinov, M. Baldo-Ceolin, P. Benetti, F. Calaprice, E. Calligarich, M. Cambiaghi, N. Canci, F. Carbonara, F. Cavanna, S. Centr… 展开作者

R. Acciarri, M. Antonello, B. Baibussinov, M. Baldo-Ceolin, P. Benetti, F. Calaprice, E. Calligarich, M. Cambiaghi, N. Canci, F. Carbonara, F. Cavanna, S. Centro, A. G. Cocco, F. Di Pompeo, G. Fiorillo, C. Galbiati, V. Gallo, L. Grandi, G. Meng, I. Modena, C. Montanari, O. Palamara, L. Pandola, F. Pietropaolo, G. L. Raselli, M. Roncadelli, M. Rossella, C. Rubbia, E. Segreto, A. M. Szelc, F. Tortorici, S. Ventura, C. Vignoli

摘要:

在WArP R&D计划中,INFN-Gran Sasso实验室(LNGS,意大利)对液态氩中氧污染的影响进行了专门测试。使用了两种探测器:WArP 2.3 lt原型和一个小型(0.7 lt)专用探测器,以及用于注入受控量气态氧的系统。使用0.7 lt检测器进行测试的目的是检测氧气浓度增加时氩闪烁光发射的长寿命组件寿命的减少。来自WArP原型的数据用于确定在采集运行期间在闭环中激活的O2纯化过程期间的电离电子寿命和闪烁长寿命组件寿命的行为。电子寿命测量允许推断氩气的O2含量,并将其与长寿命闪烁寿命数据相关联。因此,在从约10^-3 ppm到约10 ppm的宽O2浓度范围内测量了氧污染对闪烁光的影响。已发现LAr中氧诱导的光猝灭过程的速率常数为k '(O2)=0.54+-0.03 μ s ^-1 ppm^-1。

英文摘要:

A dedicated test of the effects of Oxygen contamination in liquid Argon has been performed at the INFN-Gran Sasso Laboratory (LNGS, Italy) within the WArP R&D program. Two detectors have been used: the WArP 2.3 lt prototype and a small (0.7 lt) dedicated detector, coupled with a system for the injection of controlled amounts of gaseous Oxygen. Purpose of the test with the 0.7 lt detector is to detect the reduction of the long-lived component lifetime of the Argon scintillation light emission at increasing O2 concentration. Data from the WArP prototype are used for determining the behavior of both the ionization electron lifetime and the scintillation long-lived component lifetime during the O2-purification process activated in closed loop during the acquisition run. The electron lifetime measurements allow to infer the O2 content of the Argon and correlate it with the long-lived scintillation lifetime data. The effect of Oxygen contamination on the scintillation light has been thus measured over a wide range of O2 concentration, spanning from about 10^-3 ppm up to about 10 ppm. The rate constant of the light quenching process induced by Oxygen in LAr has been found to be k'(O2)=0.54+-0.03 micros^-1 ppm^-1.

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