Regret Analysis of Posterior Sampling-Based Expected Improvement for Bayesian Optimization
机构 * Nagoya University(名古屋大学) ; RIKEN(理化学研究所) ; AIP(Advanced Institute for Particle Physics) ; Nagoya Institute of Technology(名古屋工业大学)
Comments 38pages, 5 figures, accepted to TMLR (https://openreview.net/forum?id=v0s9knY99c)