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arXiv quant-ph/0511257quant-ph
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量子比特寄存器的近完美同时测量

Near-Perfect Simultaneous Measurement of a Qubit Register

M. Acton, K. -A. Brickman, P. C. Haljan, P. J. Lee, L. Deslauriers, C. Monroe

摘要:

利用增强型电荷耦合器件(CCD)成像仪实现了对111Cd+离子超精细能级中多个量子比特的同时测量。提出了超精细量子比特荧光检测的一般理论,并应用于实验数据。用于光子检测的成像器的使用允许具有大于98%的检测准确度的多量子位状态测量。在可扩展量子计算架构的背景下讨论了读出速度和保真度的改进。

英文摘要:

Simultaneous measurement of multiple qubits stored in hyperfine levels of trapped 111Cd+ ions is realized with an intensified charge-coupled device (CCD) imager. A general theory of fluorescence detection for hyperfine qubits is presented and applied to experimental data. The use of an imager for photon detection allows for multiple qubit state measurement with detection fidelities of greater than 98%. Improvements in readout speed and fidelity are discussed in the context of scalable quantum computation architectures.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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