测量仪器的量子校准
Quantum calibration of measuring apparatuses
摘要：
通过量子校准，我们命名为一个实验程序，易于完全表征一个未知的测量设备，通过比较它与其他校准设备。在这里，我们展示了如何实现任意测量仪器的校准，通过使用它与“断层摄影机”在相关设置与输入二分系统。该方法是强大的断层摄影机的缺陷，并适用于几乎任何输入状态的二分系统。
英文摘要：
By quantum calibration we name an experimental procedure apt to completely characterize an unknown measurement apparatus by comparing it with other calibrated apparatuses. Here we show how to achieve the calibration of an arbitrary measuring apparatus, by using it in conjunction with a ``tomographer'' in a correlation setup with an input bipartite system. The method is robust to imperfections of the tomographer, and works for practically any input state of the bipartite system.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
