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arXiv physics/0608301physics.optics
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阴性index of refraction的实验证明

Experimental demonstration of negative index of refraction

Jiangfeng Zhou, Thomas Koschny, Lei Zhang, Gary Tuttle, Costas M. Soukoulis

摘要:

我们介绍了一种改进和简化的结构,由H形金属线对的周期性阵列制成,提供了一种潜在的更简单的方法来构建负折射率材料。使用模拟和微波实验,我们已经研究了这些结构的负折射率n属性。实验测量了薄膜的透射率和反射率,明确地发现当Re(n)<0和Im(n)<Re(n)时,薄膜具有负折射率。、穆也是如此。我们的研究结果表明,H形线对可以非常有效地用于生产具有负折射率的材料。

英文摘要:

We introduce an improved and simplified structure made of periodic arrays of pairs of H-shaped metallic wires that offer a potentially simpler approach in building negative-index materials. Using simulations and microwave experiments, we have investigated the negative-index n properties of these structures. We have measured experimentally both the transmittance and the reflectance properties and found unambiguously that a negative refractive index with Re(n)<0 and Im(n) <Re(n). The same is true for epsilon and mu. Our results show that H-shaped wire pairs can be used very effectively in producing materials with negative refractive indices.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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