动态力谱：观察总谐波失真
Dynamic Force Spectroscopy: Looking at the Total Harmonic Distortion
摘要：
轻敲模式原子力显微镜是用于纳米尺度的检测和分析的标准技术。由于针尖样品相互作用的系统的非线性动力学的理解是一个正确的解释动态AFM获得的数据的重要前提。本文对双模式原子力显微镜（AFM）的系统响应进行了数值模拟。在计算机模型中，原子力显微镜微悬臂梁被视为一个分布参数系统。用这种多自由度方法模拟了动态原子力显微镜光谱中的总谐波畸变。
英文摘要：
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a correct interpretation data acquired by dynamic AFM. Here, the system response in tapping-mode atomic force microscope (AFM) simulated numerically. In the computer model the AFM microcantilever is treated as a distributed parameter system. With this multiple-degree-of-freedom (MDOF) approach the the total harmonic distortion in dynamic AFM spectroscopy is simulated.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
