arXivDaily arXiv每日学术速递 周一至周五更新
arXiv physics/0401157physics.atom-ph
收藏

Recombination of low energy electrons with U$^{28+}$

S Sahoo, G. F. Gribakin, V Dzuba

英文摘要:

We performed an extensive study of configuration mixing between the doubly excited (doorway) states and complex multiply excited states of U$^{28+}$ near its ionization threshold. The detailed investigation of complex spectrum and analysis of the statistics of eigenstate components show that the dielectronic (doorway) states weakly mixed with each other. However, they show substantial mixing with the complex multiply excited states. This situation explains the mechanism of low energy electron recombination with U$^{28+}$. We calculated the energy averaged capture cross sections as a sum over dielectronic doorway states and found our present calculation interprets well the experimental recombination rates in the energy range of 1 to 100 eV.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑