The near-field diffraction of fs and sub-fs light pulses by nm-size slit-type apertures and its implication for near-field scanning optical microscopy (NSOM) is analyzed. The amplitude distributions of the diffracted wave-packets having the central wavelengths in the visible spectral region are found by using the Neerhoff and Mur coupled integral equations, which are solved numerically for each Fourier's component of the wave-packet. In the case of fs pulses, the duration and transverse dimensions of the diffracted pulse remain practically the same as that of the input pulse. This demonstrates feasibility of the NSOM in which a fs pulse is used to provide the fs temporal resolution together with nm-scale spatial resolution. In the sub-fs domain, the Fourier spectrum of the transmitted pulse experiences a considerable narrowing that leads to the increase of the pulse duration in a few times. This imposes a limit on the simultaneous resolutions in time and space.
Diffraction Interference Induced Superfocusing in Nonlinear Talbot Effect
报道了一种简单、新颖的亚衍射方法，即衍射干涉诱导的二次谐波Talbot效应超聚焦，在不涉及倏逝波或亚波长孔径的情况下实现了小于λ pump/8的聚焦尺寸。通过用菲涅耳衍射干涉剪裁点扩散函数，我们观察到周期性的SH亚衍射斑点超过一百微米远离样品。我们的演示是Toraldo Di Francia 60年前提出的超分辨率成像提案的首次实验实现。
Synthetic-Aperture Super-Resolution Imaging via Spatial-Frequency Shift in Near-Field Diffraction
School of Electronic Science and Engineering, Southeast University（东南大学电子科学与工程学院）；School of Optoelectronic Engineering, Henan Normal University（河南师范大学光电工程学院）；School of Computer and Electronic Information, Nanjing Normal University（南京师范大学计算机与电子信息学院）；Yangzhou Jinghong Laser Technology Co., Ltd.（扬州景弘激光技术有限公司）
Super-resolution three-dimensional fluorescence and optical diffraction tomography of live cells using structured illumination generated by a digital micromirror device
Resolution enhancement by extrapolation of coherent diffraction images: A quantitative study on the limits and a numerical study of non-binary and phase objects
Deep Learning Enables Large Depth-of-Field Images for Sub-Diffraction-Limit Scanning Superlens Microscopy
City University of Hong Kong（香港城市大学）；State Key Laboratory of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences（中国科学院沈阳自动化研究所机器人学国家重点实验室）；Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences（中国科学院机器人与智能制造创新研究院）；The University of Hong Kong（香港大学）；City University of Hong Kong Shenzhen Research Institute (CityUSRI)（香港城市大学深圳研究院）
