钽膜中不同Ta/ Sapphire界面的准粒子光谱学
Quasiparticle spectroscopy in tantalum films with different Ta/sapphire interfaces
AI总结：
本研究通过频域谐振器测量Meissner态磁化率，揭示了不同Ta/Sapphire界面钽膜中低能准粒子激发的特性，为理解超导损耗机制提供了新方法。
摘要：
当前量子信息科学研究中的一个关键方面是识别和控制超导电路中的损耗机制。尽管微波测量直接量化设备性能，但还需要额外的技术来探测超导薄膜中的准粒子激发，以理解耗散和退相干的微观机制。在这里，我们通过使用专门设计用于薄膜的高精度频域谐振器测量Meissner态磁化率，展示了Ta/Sapphire薄膜的准粒子光谱学结果。我们发现，在内部品质因子较低的样品中存在额外的低能激发。这些激发与由于双态系统引起的深亚隙态、接近间隙边缘的Yu-Shiba-Rusinov态以及可能的其他破对机制一致。所开发的非破坏性频域准粒子光谱学是量子材料工具箱中的宝贵补充。
英文摘要：
One of the crucial aspects of current research in quantum information science is the identification and control of loss mechanisms in superconducting circuits. Although microwave measurements directly quantify device performance, additional techniques that probe quasiparticle excitations in superconducting films are needed to understand the microscopic mechanisms underlying dissipation and decoherence. Here, we present results from quasiparticle spectroscopy of Ta/sapphire films by measuring the Meissner-state magnetic susceptibility using a precision frequency-domain resonator specifically designed for thin films. We find direct evidence for additional low-energy excitations in samples with lower internal quality factors. These excitations are consistent with deep subgap states due to two-level systems, Yu-Shiba-Rusinov states near the gap edge, and perhaps other pair-breaking mechanisms. The developed non-destructive frequency-domain quasiparticle spectroscopy is a valuable addition to the quantum materials toolbox.
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