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arXiv 2602.04010stat.ME
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基于扩展Bregman散度的互信息的稳健非参数两样本检验

Robust Nonparametric Two-Sample Tests via Mutual Information using Extended Bregman Divergence

Novartis AG(诺华公司)

Arijit Pyne

AI总结:

本文提出基于扩展Bregman散度的互信息非参数两样本检验,具有稳健性和高渐近效率,通过模拟验证其在污染下的优越性能。

摘要:

我们介绍了一种基于扩展Bregman散度的互信息(MI)的广义形式,这是一种框架,涵盖了广义S-Bregman(GSB)散度家族。GSB散度统一了两种重要的统计距离类别,即S散度和Bregman指数散度(BED),从而涵盖了几个广泛使用的子家族,包括幂散度(PD)、密度幂散度(DPD)和S-Hellinger距离(S-HD)。在参数推断中,最小散度估计器广为人知,能够平衡稳健性和最大似然估计器的高渐近效率。然而,基于此类统计距离的非参数检验相对较少被探索。在本文中,我们构建了一类一致且稳健的非参数两样本检验,用于检验两个绝对连续分布的相等性,使用广义MI。我们建立了在原假设和连续替代假设下所提检验统计量的渐近正态性。通过影响函数和破环点对广义MI的稳健性进行了严格研究,证明了广义MI的稳定性转化为相关检验的稳定性。广泛的模拟研究显示,超越PD家族的散度在污染下往往能获得更好的稳健性,同时保持高渐近功率。还提出了一种数据驱动的方案来选择最优的调节参数。最后,该方法通过实际数据的应用进行了说明。

英文摘要:

We introduce a generalized formulation of mutual information (MI) based on the extended Bregman divergence, a framework that subsumes the generalized S-Bregman (GSB) divergence family. The GSB divergence unifies two important classes of statistical distances, namely the S-divergence and the Bregman exponential divergence (BED), thereby encompassing several widely used subfamilies, including the power divergence (PD), density power divergence (DPD), and S-Hellinger distance (S-HD). In parametric inference, minimum divergence estimators are well known to balance robustness with high asymptotic efficiency relative to the maximum likelihood estimator. However, nonparametric tests based on such statistical distances have been relatively less explored. In this paper, we construct a class of consistent and robust nonparametric two-sample tests for the equality of two absolutely continuous distributions using the generalized MI. We establish the asymptotic normality of the proposed test statistics under the null and contiguous alternatives. The robustness properties of the generalized MI are rigorously studied through the influence function and the breakdown point, demonstrating that stability of the generalized MI translates into stability of the associated tests. Extensive simulation studies show that divergences beyond the PD family often yield superior robustness under contamination while retaining high asymptotic power. A data-driven scheme for selecting optimal tuning parameters is also proposed. Finally, the methodology is illustrated with applications to real data.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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