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arXiv 2410.21995cond-mat.mes-hall
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多探针分析用于分离量子自旋霍尔绝缘体中的边缘电流与体电流并分析其温度依赖性

Multi-probe analysis to separate edge currents from bulk currents in quantum spin Hall insulators and to analyze their temperature dependence

S. Benlenqwanssa, S. S. Krishtopenko, M. Meyer, B. Benhamou-Bui, L. Bonnet, A. Wolf, C. Bray, C. Consejo, S. Ruffenach, S. Nanot, J. -B. Rodriguez, E. Tournié, … 展开作者

S. Benlenqwanssa, S. S. Krishtopenko, M. Meyer, B. Benhamou-Bui, L. Bonnet, A. Wolf, C. Bray, C. Consejo, S. Ruffenach, S. Nanot, J. -B. Rodriguez, E. Tournié, F. Hartmann, S. Höfling, F. Teppe, B. Jouault

AI总结:

本文提出多探针输运分析方法,在InAs/GaInSb量子阱霍尔条器件中分离体电流与边缘电流,分别评估其温度依赖性,并将边缘电导率行为归因于Ga反位缺陷引起的局域磁矩背散射。

摘要:

我们提出了一种多探针输运分析方法,能够有效分离具有标准几何结构的大型霍尔条器件中的体电流和边缘电流。将该方法应用于由倒置三层InAs/GaInSb量子阱(QWs)制成的六探针霍尔条器件在所有可能的四探针配置下的输运测量,我们的分析不仅揭示了拓扑能隙中存在耗散性边缘电流,还允许分别评估体电导率和边缘电导率的温度依赖性。对于10 μm至70 μm的霍尔条通道,在1.5 K至45 K范围内,边缘电导率的温度依赖性与弱相互作用螺旋边缘电子的理论预期一致,其中背散射源于电荷杂质的局域磁矩。我们认为这些电荷杂质天然地与InAs/Ga(In)Sb基量子阱中充当双受主的本征Ga反位缺陷相关。

英文摘要:

We present a multi-probe transport analysis that effectively separates bulk and edge currents in large Hall bar devices with standard geometries. Applied to transport measurements on all possible four-probe configurations of six-probe Hall bar devices made of inverted three-layer InAs/GaInSb quantum wells (QWs), our analysis not only reveals the presence of dissipative edge currents in the topological gap, but also allows the temperature dependence of bulk and edge conductivity to be evaluated separately. The temperature dependence of the edge conductivity for Hall bar channels from 10 $μ$m to 70~$μ$m in the range of 1.5 K to 45 K is consistent with the theoretical expectation of weakly interacting helical edge electrons with backscattering due to localized magnetic moments of charge impurities. We argue that these charge impurities are naturally associated with intrinsic Ga-antisite defects, which act as double acceptors in InAs/Ga(In)Sb-based QWs.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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