激光照射对逻辑单元电流消耗的影响研究
On the Influence of the Laser Illumination on the Logic Cells Current Consumption
AI总结：
本研究针对物理侧信道攻击下CMOS芯片的安全问题，通过实验验证了光调制的依赖数据的静态功耗相关的CMOS漏洞，补充了此前仅仿真验证的不足，为芯片安全防护提供了实验依据。
摘要：
物理侧信道攻击是当前芯片设计面临的一大挑战。尽管针对CMOS动态功耗的攻击属于一类最先进的攻击手段，但还有许多其他效应也可能类似地影响CMOS芯片的安全性，它们主要作用于芯片的静态特性，包括老化、电离辐射或CMOS的非电离照射。利用CMOS静态功耗中数据相关性的漏洞已在实践中得到验证，而利用光调制静态功耗的类似漏洞仅通过仿真得到了证实。本研究通过实验证实了与光调制的、依赖数据的静态功耗相关的CMOS漏洞，并对未来工作进行了探讨。
英文摘要：
Physical side-channel attacks represent a great challenge for today's chip design. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, many other effects potentially affect the security of CMOS chips analogously by affecting mostly static behaviour of the chip, including aging, ionizing radiation, or non-ionizing illumination of the CMOS. Vulnerabilities exploiting data dependency in CMOS static power were already demonstrated in practice and the analogous vulnerability exploiting light-modulated static power was demonstrated by simulation. This work confirms the CMOS vulnerability related to the light-modulated data-dependent static power experimentally and discusses future work.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
