Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy
Mauricio Cattaneo, Knut Müller-Caspary, Juri Barthel, Katherine E. Mac Arthur, Nicolas Gauquelin, Marta Lipinska-Chwalek, Johan Verbeeck, Leslie J. Allen, Rafal E. Dunin-Borkowski
Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM (STEM) data to determine the local mistilt from a major zone axis. It is based on a geometric analysis of Kikuchi bands within a single diffraction pattern, yielding the centre of the Laue circle. Whereas the approach is not limited to convergent illumination, it is here developed using unit-cell averaged diffraction patterns corresponding to high-resolution STEM settings. In simulation studies, an accuracy of approximately 0.1mrad is found. The method is implemented in automated software and applied to crystallographic tilt and in-plane rotation mapping in two experimental cases. In particular, orientation maps of high-Mn steel and an epitaxially grown La$_{\text{0.7}}$Sr$_{\text{0.3}}$MnO$_{\text{3}}$-SrTiO$_{\text{3}}$ interface are presented. The results confirm the estimates of the simulation study and indicate that tilt mapping can be performed consistently over a wide field of view with diameters well above 100nm at unit cell real space sampling.
Thermal diffuse scattering in TEM: complex absorptive potentials compared to the frozen phonon model
Institute of Physical Engineering, Brno University of Technology（Brno理工大学物理工程学院）；Department of Physics and Astronomy, Uppsala University（乌普萨拉大学物理与天文学系）
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector
Imperial College London（帝国理工学院）；UBC（不列颠哥伦比亚大学）；University of Nottingham（诺丁汉大学）；University College London（伦敦大学学院）；London Centre for Nanotechnology（伦敦纳米技术中心）；Lawrence Berkeley National Laboratory（劳伦斯伯克利国家实验室）；Molecular Foundry（分子发现中心）
Dynamical diffraction formalism for imaging time-dependent diffuse scattering from coherent phonons with Dark-Field X-ray Microscopy
Stanford University（斯坦福大学）；SLAC National Accelerator Laboratory（SLAC国家加速器实验室）；SIMES, Stanford University（斯坦福大学同步辐射实验站）；PULSE Institute, Stanford University（斯坦福大学脉冲科学研究所）；Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie（马克斯·玻恩非线性光学和超快光谱学研究所）
Direct Orientation Contrast Imaging of Anti-Phase Domains on III-V Materials Using Scanning Electron Microscopy
Univ Rennes, INSA Rennes, CNRS, Institut FOTON - UMR 6082（雷恩大学，雷恩国立应用科学学院，法国国家科学研究中心，FOTON研究所）；Centre de Nanosciences et de Nanotechnologies, CNRS（纳米科学与工程中心，法国国家科学研究中心）；Thales Research and Technology（泰雷兹研究与技术）；III-V Lab（III-V实验室）；IHP-Leibniz Institut für Innovative Mikroelektronik（IHP-莱布尼茨创新微电子研究所）
Correlating Local Chemical and Structural Order Using Geographic Information Systems-Based Spatial Statistics
通过（扫描）透射电子显微镜（S/TEM）成像的纳米级短程化学和/或结构顺序的分析从根本上受到三维样品的投影的限制，其沿光束方向平均化信息。因此，从这些二维数据集确定的结构和化学之间提取统计上显著的空间相关性仍然具有挑战性。在这里，我们应用地理信息系统（GIS）中常用的方法来确定从原子分辨率STEM成像的组成复杂的弛豫体，Pb（Mg $_{1/3}$ Nb $_{2/3}$）O $_{3}$（PMN）的局部化学和结构的措施之间的空间相关性。该方法用于确定存在的排序类型，并量化化学顺序，氧八面体扭曲和氧八面体倾斜的空间变化。这些短程有序区域之间的自相关性和特征间相关性的程度，然后通过空间协方差分析进行评估，显示作为距离的函数的相关性。结果表明，集成GIS工具分析显微镜数据集可以解开复杂材料中的化学和结构特征之间的微妙关系，这些特征在忽略其空间分布时可能被隐藏。
