用于扫描透射电子显微镜的通用侧入式激光系统
A Versatile Side Entry Laser System for Scanning Transmission Electron Microscopy
AI总结：
本文提出了一种用于超高真空扫描透射电子显微镜的通用侧入式激光系统，通过通用探头与样品架反射镜设计实现免倾斜照明与原位激光烧蚀，将电子显微镜从分析工具转变为可进行原子尺度制造与逐原子实验的灵活合成系统。
摘要：
我们提出了一种为超高真空扫描透射电子显微镜设计的侧入式激光系统的设计与实现。该系统采用封闭在真空包壳内的通用探头设计，使得各部件可以在不干扰真空的情况下轻松对准、修改或更换。系统使用安装在样品架上的反射镜，使得样品无需倾斜即可被照明。值得注意的是，该反射镜可以移除并替换为烧蚀靶，并使用更高功率的激光将材料直接烧蚀到样品上。我们认为，这些新能力有望将电子显微镜从分析工具转变为更灵活的合成系统，从而能够进行原子尺度制造和逐原子实验。
英文摘要：
We present the design and implementation of a side entry laser system designed for an ultra-high vacuum scanning transmission electron microscope. This system uses a versatile probe design enclosed in a vacuum envelope such that parts can be easily aligned, modified, or exchanged without disturbing the vacuum. The system uses a mirror mounted on the sample holder such that the sample can be illuminated without being tilted. Notably the mirror can be removed and replaced with an ablation target and a higher power laser used to ablate material directly onto the sample. We argue that new capabilities hold the potential to transform the electron microscope from an analysis tool towards a more flexible synthesis system, where atomic scale fabrication and atom-by-atom experiments can be performed.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
