用于表征EXCLAIM u-Spec集成光谱仪的光学测试台优化
Optimization of an Optical Testbed for Characterization of EXCLAIM u-Spec Integrated Spectrometers
AI总结：
本研究优化了用于表征EXCLAIM任务u-Spec集成超导光谱仪的光学测试台，采用光混频源、片上参考探测器和硅标准具，实现了光谱响应表征与绝对频率校准。
摘要：
我们介绍了一款测试台，用于表征为低温大孔径强度测绘实验（Experiment for Cryogenic Large-Aperture Intensity Mapping，EXCLAIM）任务研发的紧凑型超导片上光谱仪的光学响应。EXCLAIM是一项球载远红外实验，旨在探测红移3.5至今的星系中的CO和CII发射线。这款名为u-Spec的光谱仪包含硅片上的衍射光栅，该光栅与通过单根微波馈线读出的动力学电感探测器（kinetic inductance detectors，KIDs）耦合。我们使用EXCLAIM的原型光谱仪，验证了利用光混频源表征光谱仪光谱响应的能力。我们采用片上参考探测器来校准消除片外光学元件带来的光谱结构影响，并使用硅标准具校准绝对频率。
英文摘要：
We describe a testbed to characterize the optical response of compact superconducting on-chip spectrometers in development for the Experiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM) mission. EXCLAIM is a balloonborne far-infrared experiment to probe the CO and CII emission lines in galaxies from redshift 3.5 to the present. The spectrometer, called u-Spec, comprises a diffraction grating on a silicon chip coupled to kinetic inductance detectors (KIDs) read out via a single microwave feedline. We use a prototype spectrometer for EXCLAIM to demonstrate our ability to characterize the spectrometers spectral response using a photomixer source. We utilize an on-chip reference detector to normalize relative to spectral structure from the off-chip optics and a silicon etalon to calibrate the absolute frequency.
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