利用自旋分辨横向磁聚焦探测费米面宇称
Probing Fermi surface parity with spin resolved transverse magnetic focussing
AI总结：
本文提出利用横向磁聚焦探测二维系统费米面宇称变化，证明该方法比传统二维技术灵敏度高一个数量级，可推广至其他二维体系。
摘要：
费米面测量是确定固体电学和磁学性质的基本技术。在二维系统中，费米面的面积和直径通常分别通过 Shubnikov-de Haas 振荡和公度振荡来测量。然而，这些技术无法检测费米面宇称的变化（即当 +k ≠ -k 时）。在这里，我们展示了横向磁聚焦可用于检测此类变化，因为聚焦仅测量费米面中明确定义的部分，而不会对 +k 和 -k 进行平均。此外，我们的结果表明，与其他二维技术相比，聚焦对费米面变化的灵敏度高出一个数量级，并且可用于研究其他二维系统中类似的费米面变化。
英文摘要：
Measurements of the Fermi surface are a fundamental technique for determining the electrical and magnetic properties of solids. In 2D systems, the area and diameter of the Fermi surface is typically measured using Shubnikov-de Haas oscillations and commensurability oscillations respectively. However, these techniques are unable to detect changes in the parity of the Fermi surface (i.e. when +k $\neq$ -k). Here, we show that transverse magnetic focussing can be used to detect such changes, because focussing only measures a well defined section of the Fermi surface and does not average over +k and -k. Furthermore, our results show that focussing is an order of magnitude more sensitive to changes in the Fermi surface than other 2D techniques, and could be used to investigate similar Fermi surface changes in other 2D systems.
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