AI 中文总结
研究 CrSBr 中层奇偶性和扭曲相关磁性，利用 X 射线磁圆二色性和线性二色性结合光发射电子显微镜解析其磁序，揭示纳米尺度磁结构及相关依赖性，还发现正交扭曲双层结构磁易轴的不同，为莫尔磁性开辟新途径。
AI 中文摘要
基于范德华（vdW）的反铁磁体（AFM）是探索和理解厚度及扭曲角相关的新兴自旋现象的理想平台。然而，原子级薄的基于 vdW 的 AFM 系统中自旋结构的元素特异性纳米级表征和层奇偶性效应仍不清楚。本文利用 X 射线磁圆二色性和线性二色性结合光发射电子显微镜来解析原子级薄的 CrSBr 中的磁序。综合测量揭示了 CrSBr 在纳米尺度的磁结构及其对层数、表面封装、温度和外加磁场的依赖性。此外，在通过将两个 CrSBr 铁磁单层扭转 90°获得的正交扭曲双层结构中，磁易轴与单个单层有根本不同，为莫尔磁性开辟了新途径。
英文摘要
Van der Waals (vdW) based antiferromagnets (AFMs) are an ideal platform for probing and understanding thickness- and twist-angle-dependent emergent spin phenomena. However, element-specific nanoscale characterization of the spin structure in atomically thin vdW-based AFMs systems and layer-parity effects remain elusive, making them crucial for both fundamental insight into low-dimensional magnetism and the rational design of spintronic devices based on these materials. Here, we utilize X-ray magnetic circular and linear dichroisms paired with photoemission electron microscopy to resolve the magnetic order in atomically thin CrSBr. Our comprehensive measurements reveal CrSBr magnetic structure at the nanoscale and its dependence on the layer number, surface encapsulation, temperature, and applied field. Moreover, in the orthogonally twisted bilayer configuration, obtained by twisting two CrSBr ferromagnetic monolayers by 90$^\circ$, the magnetic easy axis fundamentally differs from the individual monolayers, unlocking a new pathway for moiré magnetism.
