arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2309.03400cond-mat.mes-hall
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使用Hubbard模型对双量子点的自动表征

Automated Characterization of a Double Quantum Dot using the Hubbard Model

Will Wang, John Dean Rooney, Hongwen Jiang

AI总结:

本文提出一种基于双退火优化器的自动表征算法,可从实验稳定性图中高效提取Hubbard模型的隧穿耦合和电容耦合能等参数,且与成熟方法结果一致。

摘要:

半导体量子点因其长相干时间和潜在的可扩展性,成为量子信息处理的有利候选者。然而,互连量子点阵列的校准和表征已被证明是具有挑战性的任务。表征此类阵列配置的一种方法涉及使用Hubbard模型。在本文中,我们提出了一种自动表征算法,该算法能从实验稳定性图中高效提取Hubbard模型参数,包括隧穿耦合和电容耦合能。利用双退火优化器,我们确定了最能表征实验数据的Hubbard参数集。我们将我们的方法与另一种成熟的隧穿耦合测量方法进行了比较,发现在所研究的范围内两者具有良好的一致性。我们提取的隧穿耦合范围为69至517 μeV,并讨论了该方法的限制因素。

英文摘要:

Semiconductor quantum dots are favorable candidates for quantum information processing due to their long coherence time and potential scalability. However, the calibration and characterization of interconnected quantum dot arrays have proven to be challenging tasks. One method to characterize the configuration of such an array involves using the Hubbard model. In this paper, we present an automated characterization algorithm that efficiently extracts the Hubbard model parameters, including tunnel coupling and capacitive coupling energy, from experimental stability diagrams. Leveraging the dual annealing optimizer, we determine the set of Hubbard parameters that best characterize the experimental data. We compare our method with an alternate, well-established measure of the tunnel coupling and find good agreement within the investigated regime. Our extracted tunnel couplings range from 69 to 517 $μ$eV, and we discuss the limiting factors of our method.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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