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arXiv 2302.03079cond-mat.mes-hallcs.ET

忆阻器器件中电阻跳变的概率模型

A probabilistic model of resistance jumps in memristive devices

V. A. Slipko, Y. V. Pershin

AI总结:

针对忆阻类电阻切换器件逐周期变异性难以被确定性模型刻画的问题,提出基于状态概率分布函数与积分微分方程的随机跳变切换过程模型,得到两类案例的解析与数值解,丰富了相关器件的建模工具。

摘要:

电阻切换存储单元(例如电化学金属化单元和价态变化机制单元)有望革新信息处理与存储领域。然而,制备确定性电阻切换器件仍是一项悬而未决的挑战性难题。目前,电阻切换单元的建模主要依赖确定性模型,这类模型无法捕捉器件固有的逐周期变异性。本文提出一种状态概率分布函数及对应的积分微分方程,用于描述由一系列随机跳变构成的切换过程,并在两个模型案例中求得该方程的数值解与解析解。本工作扩充了电阻切换单元及相关器件的可用模型工具库,可实现对器件固有物理行为的严格描述,这是其他模型无法做到的。

英文摘要:

Resistance switching memory cells such as electrochemical metallization cells and valence change mechanism cells have the potential to revolutionize information processing and storage. However, the creation of deterministic resistance switching devices is a challenging problem that is still open. At present, the modeling of resistance switching cells is dominantly based on deterministic models that fail to capture the cycle-to-cycle variability intrinsic to these devices. Herewith we introduce a state probability distribution function and associated integro-differential equation to describe the switching process consisting of a set of stochastic jumps. Numerical and analytical solutions of the equation have been found in two model cases. This work expands the toolbox of models available for resistance switching cells and related devices, and enables a rigorous description of intrinsic physical behavior not available in other models.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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