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arXiv 2209.03036quant-ph
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微波谐振器测量中的 Fano 干涉

Fano Interference in Microwave Resonator Measurements

D. Rieger, S. Günzler, M. Spiecker, A. Nambisan, W. Wernsdorfer, I. M. Pop

AI总结:

本文揭示了微波谐振器测量中信号与背景路径的 Fano 干涉会导致内部品质因子 $Q_\mathrm{i}$ 产生系统误差,并提出了表征和利用该干涉以消除误差的方法。

摘要:

谐振器测量是表征材料微波响应的一种简单而强大的工具。谐振模式的损耗由其内部品质因子 $Q_\mathrm{i}$ 量化,该因子可从微波反射或透射测量中的散射系数提取。我们在此表明,信号与背景路径之间的 Fano 干涉会导致 $Q_\mathrm{i}$ 产生系统误差。对给定装置中干涉路径的有限了解转化为 $Q_\mathrm{i}$ 的不确定度范围,该范围随耦合系数的增加而增大。我们通过实验阐明了 Fano 干涉在典型微波谐振器测量中的相关性,以及提取 $Q_\mathrm{i}$ 时遇到的陷阱。另一方面,我们还展示了如何表征并利用 Fano 干涉来消除该系统误差。

英文摘要:

Resonator measurements are a simple but powerful tool to characterize a material's microwave response. The losses of a resonant mode are quantified by its internal quality factor $Q_\mathrm{i}$, which can be extracted from the scattering coefficient in a microwave reflection or transmission measurement. Here we show that a systematic error on $Q_\mathrm{i}$ arises from Fano interference of the signal with a background path. Limited knowledge of the interfering paths in a given setup translates into a range of uncertainty for $Q_\mathrm{i}$, which increases with the coupling coefficient. We experimentally illustrate the relevance of Fano interference in typical microwave resonator measurements and the associated pitfalls encountered in extracting $Q_\mathrm{i}$. On the other hand, we also show how to characterize and utilize the Fano interference to eliminate the systematic error.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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