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arXiv 2203.13636cond-mat.mtrl-sci
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Validation of x-ray line-profile analysis of extended defects in deformed crystals

C P Race, T Ungar, G Ribarik

英文摘要:

Quantitative measurements of extended defects in crystalline materials are important in understanding material behaviour. X-ray line profile analysis provides a complement to direct counting in the electron microscope, but is an indirect method and requires validation. Previous studies have focused on comparing x-ray analysis to electron microscopy results. Instead, we use simulated defective material with known defect content and apply line profile analysis to calculated diffraction profiles to directly show that line profile analysis can reliably quantify dislocations and stacking faults.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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