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arXiv 2202.08562cond-mat.mes-hallcond-mat.mtrl-sci
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角X射线互相关分析在单晶三维倒易空间散射数据中的应用

Angular X-ray Cross-Correlation Analysis Applied to the Scattering Data in 3D Reciprocal Space from a Single Crystal

Dmitry Lapkin, Anatoly Shabalin, Janne-Mieke Meijer, Ruslan Kurta, Michael Sprung, Andrei V. Petukhov, Ivan A. Vartanyants

摘要:

我们提出了一个应用程序的角X射线互相关分析(AXCCA)的散射强度分布测量的三维(3D)倒易空间从一个单晶样品。相反,传统的应用程序的AXCCA,当平均从不同的随机取向的样品收集的许多二维(2D)衍射图案是必需的,所提出的方法给出了一个洞察到一个单一的标本的结构。这在研究不太可能具有相同结构的缺陷到达样品时特别有用。在这里,我们展示了一个例子的定性结构确定的胶体晶体上的模拟以及实验测量的三维散射强度分布。

英文摘要:

We propose an application of the Angular X-ray Cross-Correlation Analysis (AXCCA) to the scattered intensity distribution measured in three-dimensional (3D) reciprocal space from a single crystalline sample. Contrary to the conventional application of AXCCA, when averaging over many two-dimensional (2D) diffraction patterns collected from different randomly oriented samples is required, the proposed approach gives an insight into the structure of a single specimen. This is particularly useful in studies of defect-reach samples that are unlikely to have the same structure. Here, we demonstrate an example of a qualitative structure determination of a colloidal crystal on the simulated as well as experimentally measured 3D scattered intensity distributions.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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