一种高角分辨率干涉背散射仪
A high angular resolution interferometric backscatter meter
摘要：
反向散射通过产生虚假干扰而限制了许多干涉测量，包括引力波探测器。我们描述了一种直接定量测量后向散射干涉的实验方法。推导并实验验证了后向散射干涉、光束半径与散射样品双向反射分布函数之间的关系。我们还表明，我们的方法是能够测量的角度低至500 urad与160 urad角分辨率从高品质的光学后向散射。
英文摘要：
Backscatter limits many interferometric measurements, including gravitational wave detectors, by creating spurious interference. We describe an experimental method to directly and quantitatively measure the backscatter interference. We derive and verify experimentally a relation between backscatter interference, beam radius and the scattering sample bidirectional reflectance distribution function. We also demonstrate that our method is able to measure backscatter from high quality optics for angles as low as 500 urad with a 160 urad angular resolution.
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