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arXiv 2201.05826cond-mat.mtrl-sci
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六方氮化硼的介电常数、电导率与击穿电场

Dielectric permittivity, conductivity and breakdown field of hexagonal boron nitride

A. Pierret, D. Mele, H. Graef, J. Palomo, T. Taniguchi, K. Watanabe, Y. Li, B. Toury, C. Journet, P. Steyer, V. Garnier, A. Loiseau, J-M. Berroir, E. Bocquillon… 展开作者

A. Pierret, D. Mele, H. Graef, J. Palomo, T. Taniguchi, K. Watanabe, Y. Li, B. Toury, C. Journet, P. Steyer, V. Garnier, A. Loiseau, J-M. Berroir, E. Bocquillon, G. Fève, C. Voisin, E. Baudin, M. Rosticher, B. Plaçais

AI总结:

本文通过直流和射频输运测量不同厚度Au-hBN-Au电容器,确定六方氮化硼面外低场介电常数为3.4±0.2,并揭示高场漏电流遵循Frenkel-Pool陷阱辅助输运机制。

摘要:

鉴于六方氮化硼(hBN)在二维材料电子学中的广泛使用,对其在低场介电常数以及高场强度和电导率直至击穿电压方面的介电表征进行细化变得十分重要。本研究旨在利用直流和射频输运,在两种Au-hBN-Au电容器系列中填补这一空白,其厚度在10--100 nm范围内可变,分别由大尺寸高压高温(HPHT)晶体和聚合物衍生陶瓷(PDC)晶体制成。我们推导出面外低场介电常数$ε_\parallel=3.4\pm0.2$,与Ohba等人的理论预测一致,从而缩小了通常接受的$ε_\parallel=3$--$4$的范围。发现高场下的直流漏电流遵循Frenkel-Pool定律,即热激活陷阱辅助电子输运,其动态介电常数$ε_\parallel\simeq3.1$,陷阱能量$Φ_B\simeq1.3\\;\mathrm{eV}$,与标准技术相关介电材料相当。

英文摘要:

In view of the extensive use of hexagonal boron nitride (hBN) in 2D material electronics, it becomes important to refine its dielectric characterization in terms of low-field permittivity and high-field strength and conductivity up to the breakdown voltage. The present study aims at filling this gap using DC and RF transport in two Au-hBN-Au capacitor series of variable thickness in the 10--100 nm range, made of large high-pressure, high-temperature (HPHT) crystals and a polymer derivative ceramics (PDC) crystals. We deduce an out-of-plane low field dielectric constant $ε_\parallel=3.4\pm0.2$ consistent with the theoretical prediction of Ohba et al., that narrows down the generally accepted window $ε_\parallel=3$--$4$. The DC-current leakage at high-field is found to obey the Frenkel-Pool law for thermally-activated trap-assisted electron transport with a dynamic dielectric constant $ε_\parallel\simeq3.1$ and a trap energy $Φ_B\simeq1.3\;\mathrm{eV}$, that is comparable with standard technologically relevant dielectrics.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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