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arXiv 2108.04646cond-mat.mes-hall
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二维横向异质结界面的二次谐波显示

Revealing Interfaces of Two-Dimensional Lateral Heterostructures by Second Harmonic Generation

Frederico B. Sousa, Lucas Lafeta, Alisson R. Cadore, Prasana K. Sahoo, Leandro M. Malard

摘要:

两种不同半导体之间的界面在决定异质结的电子特性方面至关重要,因此可以探测这些区域的新技术特别令人感兴趣。最近的研究表明,二维过渡金属二硫属化物异质结具有尖锐的外延界面,可用于下一代柔性和片上光电子器件。在这里,我们表明,二次谐波产生(SHG)可以用作一种光学工具,以揭示这些原子尖锐的界面在不同的横向异质结构。我们观察到异质结处SH强度的增强,并表明这是由于来自每种材料的SH发射的相干叠加造成的。这种建设性的干涉图案揭示了一个相位差所产生的两种材料在界面处的不同的二阶介电常数。我们的研究结果表明,SHG显微镜是一种敏感的表征技术,揭示纳米功能的层状材料及其异质结构。

英文摘要:

The interface between two different semiconductors is crucial in determining the electronic properties at the heterojunction, therefore novel techniques that can probe these regions are of particular interest. Recently it has been shown that heterojunctions of two-dimensional transition metal dichalcogenides have sharp and epitaxial interfaces that can be used to the next generation of flexible and on chip optoelectronic devices. Here, we show that second harmonic generation (SHG) can be used as an optical tool to reveal these atomically sharp interfaces in different lateral heterostructures. We observed an enhancement of the SH intensity at the heterojunctions, and showed that is due to a coherent superposition of the SH emission from each material. This constructive interference pattern reveals a phase difference arising from the distinct second-order susceptibilities of both materials at the interface. Our results demonstrate that SHG microscopy is a sensitive characterization technique to unveil nanometric features in layered materials and their heterostructures.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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