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arXiv 2107.00784cond-mat.mes-hall
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基于掺杂剂的量子比特的新特性

Novel characterisation of dopant-based qubits

B. Voisin, J. Salfi, R. Rahman, S. Rogge

摘要:

硅是一个领先的量子位平台,这要归功于可以实现的卓越的相干时间和可用的商业制造平台。构建可扩展的量子处理架构依赖于精确的量子态操纵,这只能通过对底层量子态属性的完全理解来实现。本文回顾了已经开发的电子方法来探测硅中单个和相互作用的原子量子比特中编码的量子态,从开创性的纳米级晶体管单电子隧穿光谱框架,到探测相干特性的射频反射仪和直接在原子尺度上成像波函数的扫描隧道显微镜。随着现实器件的原子模拟的发展,这些方法今天被应用于其他新兴的掺杂剂和光学可寻址缺陷态,以加速硅中量子技术的工程。

英文摘要:

Silicon is a leading qubit platform thanks to the exceptional coherence times that can be achieved and to the available commercial manufacturing platform for integration. Building scalable quantum processing architectures relies on accurate quantum state manipulation, which can only be achieved through a complete understanding of the underlying quantum state properties. This article reviews the electrical methods that have been developed to probe the quantum states encoded in individual and interacting atom qubits in silicon, from the pioneering single electron tunneling spectroscopy framework in nanoscale transistors, to radio frequency reflectometry to probe coherence properties and scanning tunneling microscopy to directly image the wave function at the atomic scale. Together with the development of atomistic simulations of realistic devices, these methods are today applied to other emerging dopant and optically addressable defect states to accelerate the engineering of quantum technologies in silicon.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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