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arXiv 2103.13846quant-phcond-mat.mtrl-sci
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电介质材料对囚禁离子的加热

Heating of a trapped ion induced by dielectric materials

Markus Teller, Dario A. Fioretto, Philip C. Holz, Philipp Schindler, Viktor Messerer, Klemens Schüppert, Yueyang Zou, Rainer Blatt, John Chiaverini, Jeremy Sage, Tracy E. Northup

摘要:

由于表面产生的电场噪声会干扰附近捕获离子的运动,从而损害作为量子计算算法基础的门操作的保真度。我们提出了一种方法,预测电介质材料对离子的运动的影响。这种离子阱是离子阱的组成部分。定量协议之间的模型,没有自由参数和测量的被困离子接近介质镜。我们希望这种方法可以用于优化基于离子阱的量子计算机和网络节点的设计。

英文摘要:

Electric-field noise due to surfaces disturbs the motion of nearby trapped ions, compromising the fidelity of gate operations that are the basis for quantum computing algorithms. We present a method that predicts the effect of dielectric materials on the ion's motion. Such dielectrics are integral components of ion traps. Quantitative agreement is found between a model with no free parameters and measurements of a trapped ion in proximity to dielectric mirrors. We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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