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arXiv 2103.13058cs.LGcs.SYeess.IVeess.SY
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面向过程控制系统嵌入高级机器学习的通用框架

Towards a General Framework to Embed Advanced Machine Learning in Process Control Systems

Norwegian Univ. of Life Sciences(挪威生命科学大学);KAI GmbH(KAI有限公司);Infineon Technologies Austria AG(英飞凌科技奥地利股份公司);Know-Center GmbH(知识中心有限公司);Graz University of Technology(格拉茨工业大学)

Stefan Schrunner, Michael Scheiber, Anna Jenul, Anja Zernig, Andre Kästner, Roman Kern

摘要:

由于在现代高端生产环境中提供的高数据量和复杂数据格式超出了经典过程控制系统的范围,因此需要涉及机器学习的更先进的工具来可靠地识别故障模式。然而,目前,这样的系统缺乏通用设置,并且仅可用作特定于应用的解决方案。我们提出了一个过程控制框架,题为健康因素的过程控制(HFPC),传统的统计工具和新的机器学习(ML)算法之间的差距。HFPC包括两个主要概念:(a)模式类型,说明质量特征(错误模式);(b)强度,量化偏离程度。虽然该系统保留了大的模型的通用性,允许广泛的潜在应用领域,我们证明了其有利的数学性质的理论分析。在半导体行业的案例研究中,我们强调:(a)我们的框架具有实际意义,超越了传统的过程控制,(b)实现了高质量的实验结果。我们的结论是,我们的工作有助于将ML集成到现实世界的过程控制中,并为制造业的自动决策支持铺平了道路。

英文摘要:

Since high data volume and complex data formats delivered in modern high-end production environments go beyond the scope of classical process control systems, more advanced tools involving machine learning are required to reliably recognize failure patterns. However, currently, such systems lack a general setup and are only available as application-specific solutions. We propose a process control framework entitled Health Factor for Process Control (HFPC) to bridge the gap between conventional statistical tools and novel machine learning (ML) algorithms. HFPC comprises two main concepts: (a) pattern type to account for qualitative characteristics (error patterns) and (b) intensity to quantify the level of a deviation. While the system retains large model generality, allowing a broad scope of potential application areas, we demonstrate its favorable mathematical properties in a theoretical analysis. In a case study from the semiconductor industry, we underline that (a) our framework is of practical relevance and goes beyond conventional process control, and (b) achieves high-quality experimental results. We conclude that our work contributes to the integration of ML in real-world process control and paves the way to automated decision support in manufacturing.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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